Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator

Authors
Krieg, J Turflinger, T Titus, J Cole, P Baker, P Gehlhausen, M Emily, D Yang, L Pease, RL Barnaby, H Schrimpf, R Maher, MC
Citation
J. Krieg et al., Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator, IEEE NUCL S, 46(6), 1999, pp. 1627-1632
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
46
Issue
6
Year of publication
1999
Part
1
Pages
1627 - 1632
Database
ISI
SICI code
0018-9499(199912)46:6<1627:HAIOBT>2.0.ZU;2-F
Abstract
The total dose response of transistors and circuits from a single wafer lot has been measured for high and low dose rate and elevated temperature irra diations. A bimodal irradiation response is observed in the circuit respons e that is shown to be a result of the input transistors. Hardness assurance sampling plans are examined for their adequacy to deal with the bimodal re sponse distributions.