The effects of architecture and process on the hardness of programmable technologies

Authors
Katz, R Wang, JJ Reed, R Kleyner, I D'Ordine, M McCollum, J Cronquist, B Howard, J
Citation
R. Katz et al., The effects of architecture and process on the hardness of programmable technologies, IEEE NUCL S, 46(6), 1999, pp. 1736-1743
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
46
Issue
6
Year of publication
1999
Part
1
Pages
1736 - 1743
Database
ISI
SICI code
0018-9499(199912)46:6<1736:TEOAAP>2.0.ZU;2-0
Abstract
Architecture and process, combined, significantly affect the hardness of pr ogrammable technologies. The effects of high energy ions, ferroelectric mem ory architectures, and shallow trench isolation are investigated. A detaile d single event latchup (SEL) study has been performed.