X-ray diffraction from pinned charge density waves

Citation
S. Rouziere et al., X-ray diffraction from pinned charge density waves, J PHYS IV, 9(P10), 1999, pp. 23-26
Citations number
12
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339 → ACNP
Volume
9
Issue
P10
Year of publication
1999
Pages
23 - 26
Database
ISI
SICI code
1155-4339(199912)9:P10<23:XDFPCD>2.0.ZU;2-F
Abstract
We present an x-ray study of doped charge density waves systems. When a 2 k appa(f)-charge density wave is strongly pinned to impurities; an interferen ce effect gives rise to all asymmetry between the intensities of the +2 kap pa(f) and -2 kappa(f) satellite reflections. Moreover, profile asymmetry of the satellite reflections indicates the existence of Friedel oscillations (FOs) around the defects. We have studied these effects in V- and W-doped b lue bronzes. A syncrotron radiation study of the V-dopted blue bronze clear ly reveals the presence of FO around the V atoms.