H. Sano et al., Images of cleaved GaAs(110) surfaces observed with a reflection optical second harmonic microscope, J APPL PHYS, 87(4), 2000, pp. 1614-1619
We have developed a reflection optical second harmonic (SH) microscope as a
new surface probe. Using the combination of the developed SH microscope, a
near infrared microscope, a confocal laser microscope, a Raman microprobe
spectrometer, and an electron probe microanalyzer for x-ray fluorescence, w
e have observed microstructures on cleaved GaAs(110) surfaces. We have demo
nstrated that slab structures on these surfaces are unambiguously identifie
d by the analysis using a combination of these microscopes. We have found t
hat the reflection SH microscope is especially sensitive to the slab struct
ures. The enhancement of second harmonic generation by the slab structure c
ould be well accounted for by an electromagnetic calculation of the SH inte
nsity. (C) 2000 American Institute of Physics. [S0021-8979(00)09004-6].