The application of a VUV Fourier transform spectrometer and synchrotron radiation source to measurements of: II. The delta(1,0) band of NO

Citation
T. Imajo et al., The application of a VUV Fourier transform spectrometer and synchrotron radiation source to measurements of: II. The delta(1,0) band of NO, J CHEM PHYS, 112(5), 2000, pp. 2251-2257
Citations number
32
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CHEMICAL PHYSICS
ISSN journal
00219606 → ACNP
Volume
112
Issue
5
Year of publication
2000
Pages
2251 - 2257
Database
ISI
SICI code
0021-9606(20000201)112:5<2251:TAOAVF>2.0.ZU;2-R
Abstract
Line-by-line photoabsorption cross-sections of the NO delta(1,0) band were measured with the VUV Fourier transform spectrometer from Imperial College, London, using synchrotron radiation at Photon Factory, KEK, Japan, as a co ntinuum light source. The analysis of the NO delta(1,0) band provides accur ate rotational line positions and term values as well as the photoabsorptio n cross-sections. The molecular constants of the C(1) (2)Pi level are found to be T-0=54 690.155 +/- 0.03 cm(-1), B-v=1.944 06 +/- 0.000 62 cm(-1), D- v=(5.91 +/- 0.42)x10(-5) cm(-1), A(D)=-0.0187 +/- 0.0050 cm(-1), p=-0.0189 +/- 0.0037 cm(-1), and q=-0.015 21 +/- 0.000 20 cm(-1). The sum of the line strengths for all rotational transitions of the NO delta(1,0) band is dete rmined as 4.80x10(-15) cm(2) cm(-1), corresponding to a band oscillator str ength of 0.0054 +/- 0.0003. (C) 2000 American Institute of Physics. [S0021- 9606(00)00805-9].