The magnetic depth profile at the interface of a permalloy/Co thin film studied by polarized neutron and X-ray reflectivity

Polarized neutron and X-ray reflectivity are complementary tools for measur ing the magnetic depth profile of a thin film. Tn this experiment, permallo y (Ni80Fe20, 30 nm) thin film was deposited on Al2O3(1 (1) over bar 00) sub strates with Co(8 nm)/Mo(18 nm) as buffer layers. The depth profile between the permalloy and Co cannot be determined by X-ray reflectivity alone beca use the electron densities are too close together. Polarized neutron reflec tivity, although available only with limited q range available, can determi ne the interface roughness between the permalloy and Co layer. (C) 2000 Els evier Science B.V. All rights reserved.