Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film

Citation
Hn. Lin et al., Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film, J MAGN MAGN, 209(1-3), 2000, pp. 243-245
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
209
Issue
1-3
Year of publication
2000
Pages
243 - 245
Database
ISI
SICI code
0304-8853(200002)209:1-3<243:MFMSOA>2.0.ZU;2-9
Abstract
An unusual orthogonal magnetic structure is observed on a cobalt film by ma gnetic force microscopy. The structure is composed of a double wall, which is caused by a surface scratch, and two perpendicular spike domains, which are caused by an internal defect. The occurrence of the structure is attrib uted to the generation of surface free poles due to film inhomogeneities an d their redistribution to reduce the magnetostatic energy. The magnetizatio n pattern has also been proposed to explain the observed magnetic force ima ge. (C) 2000 Elsevier Science B.V. All rights reserved.