A new phase unwrapping algorithm based on reliability and edge detecti
on is presented. Since the edge is detected efficiently through edge r
elaxation, the unwrapping procedure is simplified within the areas emb
raced by edges. Penetrating edges according to reliability ensures tha
t this method will limit the unwrapping error to local-minimum areas a
t worst. (C) 1997 Society of Photo-Optical instrumentation Engineers.