An improved phase algorithm for phase-measuring profilometry (PMP) is
presented. In comparison with the traditional algorithms, it can remov
e the influence of the carrier frequency before unwrapping and slow do
wn the variation of the phase. This new algorithm makes the procedure
of phase unwrapping easier and more automatic. it is especially suitab
le for PMP with a high-frequency grating. (C) 1997 Society of Photo-Op
tical instrumentation Engineers.