Atom probe field-ion microscopy: 30 years of atomic-level analysis

Authors
Miller, MK Burke, MG
Citation
Mk. Miller et Mg. Burke, Atom probe field-ion microscopy: 30 years of atomic-level analysis, MATER CHAR, 44(1-2), 2000, pp. 1-1
Categorie Soggetti
Material Science & Engineering
Journal title
MATERIALS CHARACTERIZATION
ISSN journal
10445803 → ACNP
Volume
44
Issue
1-2
Year of publication
2000
Pages
1 - 1
Database
ISI
SICI code
1044-5803(200001/02)44:1-2<1:APFM3Y>2.0.ZU;2-6