Photoelectron diffraction imaging for C2H2 and C2H4 chemisorbed on Si(100)reveals a new bonding configuration

Citation
Sh. Xu et al., Photoelectron diffraction imaging for C2H2 and C2H4 chemisorbed on Si(100)reveals a new bonding configuration, PHYS REV L, 84(5), 2000, pp. 939-942
Citations number
14
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
5
Year of publication
2000
Pages
939 - 942
Database
ISI
SICI code
0031-9007(20000131)84:5<939:PDIFCA>2.0.ZU;2-7
Abstract
A new adsorption site for adsorbed acetylene on Si(100) is observed by phot oelectron imaging based on the holographic principle. The diffraction effec ts in the carbon Is angle-resolved photoemission are inverted (including th e small-cone method) to obtain an image of the atom's neighboring carbon. T he chemisorbed acetylene molecule is bonded to four silicon surface atoms. In contrast to the C2H2 case, the image for adsorbed C2H4 shows it bonded t o two Si surface atoms.