Spectromicroscopy beamline at ELETTRA: Performances achieved at the end ofcommissioning

In the course of 1998, the Spectromicroscopy beamline at ELETTRA completed commissioning and succeeded in performing its first test experiments. The b eamline is designed to perform photoemission experiments with high spatial resolution, which is obtained by focusing the radiation in a small spot on the sample by means of a multilayer-coated Schwarzschild Objective. Three o bjectives are currently available; these operate at photon energies of 74, 95, and 110 eV. A review is presented of the performances achieved together with an outlook on the future upgrades of the microscope. The smallest ach ievable spot size is currently 0.5 mu m. At present, the limit to the spati al resolution is due to aberrations caused by figure errors of the objectiv e. Typical counting rates in photoemission spectra, for example, on the Au 5d peak, are of the order of 10(4)-10(5) counts per second with an energy r esolution of the order of 100-200 meV. Among the first experiments in which p- and n-type GaAs layers of 0.25 mu m thickness were imaged. (C) 2000 Ame rican Institute of Physics. [S0034-6748(00)04001-6].