Sapphire filter thickness optimization in neutron scattering instruments

Authors
Stamatelatos, IE Messoloras, S
Citation
Ie. Stamatelatos et S. Messoloras, Sapphire filter thickness optimization in neutron scattering instruments, REV SCI INS, 71(1), 2000, pp. 70-73
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
1
Year of publication
2000
Pages
70 - 73
Database
ISI
SICI code
0034-6748(200001)71:1<70:SFTOIN>2.0.ZU;2-Q
Abstract
The present work is concerned with the optimization of the sapphire fast ne utron filter thickness used in neutron diffraction instruments. The optimiz ation is based on maximization of the slow neutron transmission, minimizati on of the fast neutron transmission, and also taking into consideration the neutron background at the vicinity of an instrument. Scattering properties of the sapphire in the fast and slow neutron regions are discussed. (C) 20 00 American Institute of Physics. [S0034-6748(90)00301-X].