Use of focused ion beams for making tiny sample holes in gaskets for diamond anvil cells

Citation
J. Orloff et al., Use of focused ion beams for making tiny sample holes in gaskets for diamond anvil cells, REV SCI INS, 71(1), 2000, pp. 216-219
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
1
Year of publication
2000
Pages
216 - 219
Database
ISI
SICI code
0034-6748(200001)71:1<216:UOFIBF>2.0.ZU;2-Z
Abstract
To achieve multimegabar pressures in the diamond anvil cell, small diamond tips, 20 mu m (or less) in diameter and high strength gasket materials are required. To prevent plastic instability it is therefore necessary to drill sample holes with diameters of 10 mu m (or less) in extremely strong and t ough materials such as tungsten. The present paper describes a technique fo r drilling such holes using focused ion beams. The superior roundness and s urface finish of these holes is one of the reasons our group was able to re ach pressures of 342 GPa on hydrogen, significantly higher than that reache d by other researchers. (C) 2000 American Institute of Physics. [S0034-6748 (00)05101-7].