Modification of semiconductors with proton beams. A review

Citation
Vv. Kozlovskii et al., Modification of semiconductors with proton beams. A review, SEMICONDUCT, 34(2), 2000, pp. 123-140
Citations number
83
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTORS
ISSN journal
10637826 → ACNP
Volume
34
Issue
2
Year of publication
2000
Pages
123 - 140
Database
ISI
SICI code
1063-7826(2000)34:2<123:MOSWPB>2.0.ZU;2-1
Abstract
Analysis is given of the progress in the modification of semiconductors by proton beams in fields such as proton-enhanced diffusion, ion-beam mixing, and formation of porous layers. This method of modification (doping) is sho wn to have high potential in monitoring the properties of semiconductor mat erials and designing devices of micro and nano electronics as compared to t he conventional doping techniques such as thermal diffusion, epitaxy, and i on implantation. (C) 2000 MAIK "Nauka/Interperiodica".