Scanning tunneling microscopy of films of amorphous carbon doped with copper

The results of experimental studies of the copper-doped hydrogenated amorph ous carbon films by scanning tunneling microscopy and spectroscopy are repo rted. These results are indicative of the effect of spatial ordering of nan ostructures in thin films based on carbon and copper. Geometric parameters of nanostructures were measured. In the context of the Simmons model, the w ork function was estimated to be equal to phi similar to 0.05 eV. Oscillati ons in differential conductance with a period in a voltage of Delta V = 200 -400 mV were detected in tunneling contacts of Ir with the films. The origi n of the observed oscillations is discussed. (C) 2000 MAIK "Nauka/Interperi odica".