Excursion sets of random fields, which are obtained by truncating a random
field at some level, can be used to define random set models for binary ima
ges. We discuss some image models based on excursion sets which are appropr
iate for multi-phase image data. Parameter estimation for the multi-phase m
odels is discussed, and the methods are applied to some images of core samp
les of sulphide ores. (C) 2000 Elsevier Science B.V. All rights reserved.