Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging

Citation
Pe. Mazeran et Jl. Loubet, Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging, TRIBOL LETT, 7(4), 1999, pp. 199-212
Citations number
44
Categorie Soggetti
Mechanical Engineering
Journal title
TRIBOLOGY LETTERS
ISSN journal
10238883 → ACNP
Volume
7
Issue
4
Year of publication
1999
Pages
199 - 212
Database
ISI
SICI code
1023-8883(1999)7:4<199:NALMWA>2.0.ZU;2-4
Abstract
Results and an analysis are presented on elastic and friction imaging by in direct force modulation with a scanning force microscope. Two techniques ar e compared, normal modulation (Z-modulation, perpendicular to the surface o f the sample) and lateral modulation of the contact (X-modulation in the pl ane of the sample, perpendicular to the axis of the cantilever). Theoretica l and experimental results show that lateral modulation offers great advant ages compared to normal modulation: the images are free of artifacts and ca n be easily quantified.