Pe. Mazeran et Jl. Loubet, Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging, TRIBOL LETT, 7(4), 1999, pp. 199-212
Results and an analysis are presented on elastic and friction imaging by in
direct force modulation with a scanning force microscope. Two techniques ar
e compared, normal modulation (Z-modulation, perpendicular to the surface o
f the sample) and lateral modulation of the contact (X-modulation in the pl
ane of the sample, perpendicular to the axis of the cantilever). Theoretica
l and experimental results show that lateral modulation offers great advant
ages compared to normal modulation: the images are free of artifacts and ca
n be easily quantified.