Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging

Results and an analysis are presented on elastic and friction imaging by in direct force modulation with a scanning force microscope. Two techniques ar e compared, normal modulation (Z-modulation, perpendicular to the surface o f the sample) and lateral modulation of the contact (X-modulation in the pl ane of the sample, perpendicular to the axis of the cantilever). Theoretica l and experimental results show that lateral modulation offers great advant ages compared to normal modulation: the images are free of artifacts and ca n be easily quantified.