The Hall effect in Ni0.8Co0.2-SiO2 granular film

Citation
N. Gang et al., The Hall effect in Ni0.8Co0.2-SiO2 granular film, ACT PHY C E, 48(12), 1999, pp. S47-S51
Citations number
7
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA SINICA
ISSN journal
10003290 → ACNP
Volume
48
Issue
12
Year of publication
1999
Supplement
S
Pages
S47 - S51
Database
ISI
SICI code
1000-3290(199912)48:12<S47:THEING>2.0.ZU;2-P
Abstract
The Hall effect in Ni0.8Co0.2-SiO2 granular films which were fabricated by ion beam sputtering technique was studied. The saturated Hall resistivity r eached 6.3 mu Omega. cm in an applied field of 9.5 X 10(5) A/m at room temp erature when the NiCo volume fraction x is near the metal-insulator transit ion threshold. The temperature dependence of resistivity iii these samples with different NiCo compositions was also investigated. It showed - IgT dep endence in low x samples, which gradually showed metallic as x increased. T ransmission electron microscopy and vibrating sample magnetometer were used to study the microstructures and magnetic properties, the dependence of tr ansport properties on microstructure was also discussed.