The magnetic and magneto-optic properties of the amorphous TbCo/Si multilayers

The Tb0.17Co0.83/Si multilayers prepared by a rf magnetron sputtering syste m with different Si thickness have been investigated. X-ray diffraction, ma gnetic measurement and Kerr rotation have been performed. With increasing t hickness of Si layer t(Si), the perpendicular anisotropy constant K-u decre ased rapidly. The saturation magnetization M-s and the Kerr rotation theta( K) decreased linearly when tsi increased. It was assumed that Co2Si and Tb had been formed in the interfacial zone between TbCo and Si layers. The red uction of K-u, M-s and theta(K) is attributed to the decrease of the effect ive thickness of magnetic layer, which is linear with t(Si).