A cold-cathode electron impact ionization source based on field emission fr
om an array of diamond-coated silicon whiskers is described. The source is
coupled to a micro-scale ion trap mass spectrometer (r(0) = 0.50 mm, z(0) =
0.50 mm). An electron beam of 250 nA could be obtained through the 0.45-mm
diameter opening in the end cap electrode.