Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air

Authors
Fain, SC Barry, KA Bush, MG Pittenger, B Louie, RN
Citation
Sc. Fain et al., Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air, APPL PHYS L, 76(7), 2000, pp. 930-932
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
7
Year of publication
2000
Pages
930 - 932
Database
ISI
SICI code
0003-6951(20000214)76:7<930:MATFII>2.0.ZU;2-1
Abstract
A method to measure the average normal force on a surface produced by inter mittent-contact (tapping) force microscopy is presented. This force is dete rmined by measuring the average deflection of a calibrated piezoresistive c antilever in intermittent contact with an oscillating active cantilever. Re sults obtained with this method are presented for a two-state cantilever mo tion where the piezolever force is higher for the state with the lower ampl itude of vibration. (C) 2000 American Institute of Physics. [S0003-6951(00) 02007-6].