Periodic variation in optical second-harmonic generation during homoepitaxi
al growth of silicon on singular Si(001) surface is reported. The period of
the oscillations corresponds to bilayer growth, and the oscillations are c
orrelated with the mechanism associated with a two-dimensional layer-by-lay
er growth mode. This mechanism is tentatively attributed to periodic domain
coverage variations analogous to the oscillatory response in linear optica
l technique of reflectance anisotropy. The current experiment, however, can
not distinguish this mechanism from another based on anisotropic second-har
monic generation response with respect to steps. (C) 2000 American Institut
e of Physics. [S0003-6951(00)03304-0].