Hg. Boyen et al., Sequential ion-induced stress relaxation and growth: A way to prepare stress-relieved thick films of cubic boron nitride, APPL PHYS L, 76(6), 2000, pp. 709-711
It is shown that the bombardment of high quality cubic (c-) BN films with 3
00 keV Ar+ ions leads to a strong relaxation of their compressive stresses
without destroying the cubic phase if the total ion fluence is kept below a
n upper limit. In addition, it was found that on top of such a stress-relie
ved film a further pure c-BN layer can be grown, but it builds up compressi
ve stress again. Based on both results, a procedure is developed to grow th
ick (> 1 mu m) c-BN films (> 80% c-BN) exhibiting low residual stress and l
ong term stability under ambient conditions. (C) 2000 American Institute of
Physics. [S0003-6951(00)01406-6].