Patch antennas on externally perforated high dielectric constant substrates

Citation
Js. Colburn et Y. Rahmat-samii, Patch antennas on externally perforated high dielectric constant substrates, IEEE ANTENN, 47(12), 1999, pp. 1785-1794
Citations number
16
Categorie Soggetti
Information Tecnology & Communication Systems
Journal title
IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION
ISSN journal
0018926X → ACNP
Volume
47
Issue
12
Year of publication
1999
Pages
1785 - 1794
Database
ISI
SICI code
0018-926X(199912)47:12<1785:PAOEPH>2.0.ZU;2-W
Abstract
Smaller physical size and wider bandwidth are two antenna engineering goals of great interest in the wireless world. To this end, the concept of exter nal substrate perforation is applied to patch antennas in this paper. The g oal was to overcome the undesirable features of thick and high dielectric c onstant substrates for patch antennas without sacrificing any of the desire d features, namely, small element size and bandwidth. The idea is to use su bstrate perforation exterior to the patch to lower the effective dielectric constant of the substrate surrounding the patch. This change in the effect ive dielectric constant has been observed to help mitigate the unwanted int erference pattern of edge diffraction/scattering and leaky waves. The numer ical data presented in this paper were generated using the finite-differenc e time-domain (FDTD) technique. Using this numerical method, a patch antenn a was simulated on finite-sized ground planes of two different substrate th icknesses, with and without external substrate perforation. The computation s showed the directivity drop in the radiation pattern caused by substrate propagation was noticeably improved by introducing the substrate perforatio n external to the patch for the case of a patch antenna on a relatively thi ck substrate without any loss of bandwidth. Measurements of a few patch ant ennas fabricated on high dielectric constant substrates with and without su bstrate perforation are included for completness. Good correlation between the computed results and mesurements is observed.