Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging

Authors
Citation
Rf. Egerton, Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging, J ELEC MICR, 48(6), 1999, pp. 711-716
Citations number
14
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF ELECTRON MICROSCOPY
ISSN journal
00220744 → ACNP
Volume
48
Issue
6
Year of publication
1999
Pages
711 - 716
Database
ISI
SICI code
0022-0744(1999)48:6<711:SRONAB>2.0.ZU;2-L
Abstract
We consider several factors which determine the spatial resolution of eleme ntal analysis by core-loss spectroscopy or energy-filtered imaging. The phy sics of electron scattering, in combination with modern electron optics, al lows a resolution below 1 nm. However, the low core-loss cross sections imp ly that atomic resolution is only feasible for radiation-resistant specimen s and an electron microscope fitted with a field-emission source.