Rf. Egerton, Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging, J ELEC MICR, 48(6), 1999, pp. 711-716
We consider several factors which determine the spatial resolution of eleme
ntal analysis by core-loss spectroscopy or energy-filtered imaging. The phy
sics of electron scattering, in combination with modern electron optics, al
lows a resolution below 1 nm. However, the low core-loss cross sections imp
ly that atomic resolution is only feasible for radiation-resistant specimen
s and an electron microscope fitted with a field-emission source.