Design features of a new ultra-high vacuum electron microscope with an omega filter

Citation
Y. Tanishiro et al., Design features of a new ultra-high vacuum electron microscope with an omega filter, J ELEC MICR, 48(6), 1999, pp. 837-842
Citations number
21
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF ELECTRON MICROSCOPY
ISSN journal
00220744 → ACNP
Volume
48
Issue
6
Year of publication
1999
Pages
837 - 842
Database
ISI
SICI code
0022-0744(1999)48:6<837:DFOANU>2.0.ZU;2-S
Abstract
An ultra-high vacuum high-resolution electron microscope for surface and in terface structure studies was newly designed and constructed. Two new appro aches were adopted together with a field emission gun. One is to introduce an omega-type energy filter system that enables us to obtain energy-filtere d diffraction patterns and images in transmission and reflection electron m icroscopy for well defined surfaces. The other is to combine a unit of spec imen treatment chambers. Design features and some results are described.