Atomic resolution HVEM and environmental noise

After 3 years, an advanced high-voltage atomic-resolution transmission elec tron microscope (ARHVTEM) was finely tuned. Environmental mechanical vibrat ion causing serious disturbance for atomic-resolution observation was effec tively damped by an air spring suspension system. Stray magnetic fields fro m the subway running 250 m away were found to degrade the resolution of the microscope fatally. The designed resolution was recovered by producing a c ounter field around the objective lens by a three-dimensional electromagnet ic coil. For alpha-SiC, viewed along [1 (2) over bar 0], each atomic column of silicon and carbon presented distinct atomic image contrast. In diamond , viewed along [110], the 'dumbbell image' of close atomic columns which ar e separated by 0.098 nm was resolved.