Phase quantification of beta-Si3N4/beta-SiC mixtures by X-ray powder diffraction analysis

X-ray powder diffraction methods of phase quantification were adapted and c ompared to mixtures of beta-Si3N4 and beta-SiC. Multiline mean-normalized-i ntensity methods and whole pattern analysis (Rietveld) both have advantages and disadvantages over each other. Satisfactory results (less than 3% abso lute deviation) can be achieved in minimal time using intensity normalizati on methods. Phase quantification using the Rietveld method requires signifi cantly longer measuring time, evaluation time and expertise to obtain the s ame results. (C) 2000 Kluwer Academic Publishers.