Ws. Hu et al., PREPARATION OF NANOCRYSTALLINE SNO2 THIN-FILMS USED IN CHEMISORPTION SENSORS BY PULSED-LASER REACTIVE ABLATION, Journal of materials science. Materials in electronics, 8(3), 1997, pp. 155-158
Nanocrystalline SnO2 thin films were fabricated by pulsed laser reacti
ve ablation using a metallic Sn target. Oxidation of Sn to SnO2 occurr
ed principally on the substrate surface a nd was negligible during tra
nsportation of Sn atoms in the ablated plume from the target to the fi
lm. Therefore, the substrate temperature was the most important parame
ter to influence the phase constitution of the films. When the substra
te temperature was higher than the melting point of metal Sn (230 degr
ees C), SnO2 phase was obtained. Otherwise the films were beta-Sn domi
nant. X-ray diffraction and transmission electron microscopy technique
s were used to determine the grain size in the films, which was in the
range 10-30 nm, depending upon the substrate temperature and the subs
equent annealing. For chemisorption performance, films with a thicknes
s up to 24 nm showed a higher sensitivity than the films 38 nm and 96
nm thick. Excellent chemisorption properties have been achieved on the
very thin nanocrystalline films.