A. Catellani et R. Di Felice, Early stages of deposition of nitrides on cubic silicon carbide: A theoretical study, PHYS ST S-A, 177(1), 2000, pp. 99-106
We report on the early stages of deposition of nitrides on the silicon term
inated surface of cubic SiC(001), investigated by means of first principles
total-energy-and-force calculations. We present results for both atomic N
adsorption and thin AIN film formation. For many configurations containing
N adatoms with coverages less than 1/2 monolayer, nitrogen can be adsorbed
on the surface in zincblende sites. For higher coverages, zincblende adsorp
tion sites for N atoms are metastable: nitrogen preferentially forms N-2 di
mers, each N atom being threefold coordinated and bonded to two surface Si
atoms. This leads to an N-coated SIC surface free of dangling bonds. which
inhibits growth. Our results for the stability of two-dimensional AIN films
confirm that nitridation of the cubic Si-terminated SiC(001) surface shoul
d be avoided in order to grow thick wetting layers. The formation of a char
ge neutral interface, with species intermixing, is conducive to the deposit
ion of two-dimensional films. Such a mixing is achievable by starting growt
h in an Al-rich ambient.