High energy operation of the Tokyo-electron beam ion trap/present status

Authors
Kuramoto, H Shimizu, H Nakamura, N Currell, FJ Kato, D Kinugawa, T Tong, XM Watanabe, H Fukami, T Li, YM Ohtani, S Sokell, EJ Yamada, C Hirayama, T Motohashi, K Tsurubuchi, S Okazaki, K Sakurai, M Tarbutt, MR Silver, JD
Citation
H. Kuramoto et al., High energy operation of the Tokyo-electron beam ion trap/present status, REV SCI INS, 71(2), 2000, pp. 687-689
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
2
Year of publication
2000
Part
2
Pages
687 - 689
Database
ISI
SICI code
0034-6748(200002)71:2<687:HEOOTT>2.0.ZU;2-Z
Abstract
We are using the Tokyo electron beam ion trap (Tokyo-EBIT) to study a wide range of the physics of highly charged ions. Transition wavelengths have be en investigated using visible and x-ray spectroscopy. The charge-state dist ributions of the extracted ions from the trap are shown for the different e xperimental conditions. Ionization cross sections are measured by observing the time dependence of the charge state evolution in the extracted ions. A brief introduction of the recent studies is given. (C) 2000 American Insti tute of Physics. [S0034-6748(00)52302-8].