The production and use of ultralow energy ion beams

Citation
Rd. Goldberg et al., The production and use of ultralow energy ion beams, REV SCI INS, 71(2), 2000, pp. 1032-1035
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
2
Year of publication
2000
Part
2
Pages
1032 - 1035
Database
ISI
SICI code
0034-6748(200002)71:2<1032:TPAUOU>2.0.ZU;2-9
Abstract
An ion accelerator, purpose built to produce beams at energies down to 10 e V with current densities in the 10-100 mu A cm(-2) range, is described. Fit ted with dual ion source assemblies, the machine enables ultralow energy io n implantation and the growth of films and multilayers to be carried out un der highly controlled conditions. The accelerator delivers ion beams into a n ultrahigh vacuum chamber, containing a temperature controlled target stag e (range -120 to +1350 degrees C), where they are used to study the fundame ntal physics relating to the interaction of ultralow energy ions with surfa ces. This knowledge underlies a wide range of ion-beam and plasma-based tec hnologies and, to illustrate its importance, results are presented from inv estigations designed to determine the optimum conditions for the growth of diamond-like and aluminum films by ion-beam deposition and the formation of ultrashallow junctions in semiconductors by 2.5 keV As+ implantation. The later investigation shows how transient arsenic diffusion, which occurs dur ing post-implant thermal processing, can be controlled by manipulating the substrate temperature during implantation. (C) 2000 American Institute of P hysics. [S0034-6748(00)55502-6].