Measurement of the complex dielectric constant down to helium temperatures. II. Quasioptical technique from 0.03 to 1 THz

Authors
Reedijk, JA Martens, HCF Smits, BJG Brom, HB
Citation
Ja. Reedijk et al., Measurement of the complex dielectric constant down to helium temperatures. II. Quasioptical technique from 0.03 to 1 THz, REV SCI INS, 71(2), 2000, pp. 478-481
Citations number
8
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
71
Issue
2
Year of publication
2000
Part
1
Pages
478 - 481
Database
ISI
SICI code
0034-6748(200002)71:2<478:MOTCDC>2.0.ZU;2-S
Abstract
A quasioptical method is described that allows the determination of the com plex dielectric constant almost continuously in the millimeter wave regime without the use of electrical contacts. The technique allows the dielectric properties of bulk samples (solids, powders, and liquids) and thin films ( free standing or deposited on a substrate) to be measured with excellent ab solute accuracy down to 2 K. (C) 2000 American Institute of Physics. [S0034 -6748(00)04902-9].