X-ray microanalysis discloses the secrets of ancient Greek and Roman potters

Authors
Citation
P. Mirti, X-ray microanalysis discloses the secrets of ancient Greek and Roman potters, X-RAY SPECT, 29(1), 2000, pp. 63-72
Citations number
22
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
29
Issue
1
Year of publication
2000
Pages
63 - 72
Database
ISI
SICI code
0049-8246(200001/02)29:1<63:XMDTSO>2.0.ZU;2-0
Abstract
Scanning electron microscopy coupled with energy-dispersive detection of em itted x-rays (SEM-EDX) may be useful in the study of ancient ceramic materi als coated with glossy sintered slips. Backscattered and secondary electron images of fresh fractured or polished sections may give information on sli p thickness and sintering degree and on slip-to-body contact features. EDX analysis of polished sections may disclose compositional features of slips and bodies stemming from a more or less appropriate selection and processin g of clays. Insight may then be gained into the technological knowledge and skill of ancient potters. An account is given here of SEM-EDX investigatio ns performed on Creek, late Hellenistic and Roman monochrome black or red g loss pottery. These shed light on the technological achievements of potters from different historical epochs and geographical areas of the ancient wor ld. Copyright (C) 2000 John Wiley & Sons, Ltd.