Progress in scanning probe microscopy

Citation
Hk. Wickramasinghe, Progress in scanning probe microscopy, ACT MATER, 48(1), 2000, pp. 347-358
Citations number
63
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science",Metallurgy
Journal title
ACTA MATERIALIA
ISSN journal
13596454 → ACNP
Volume
48
Issue
1
Year of publication
2000
Pages
347 - 358
Database
ISI
SICI code
1359-6454(20000101)48:1<347:PISPM>2.0.ZU;2-P
Abstract
In the past decade, the field of microscopy has been revolutionized by the introduction of a range of microscopies-scanning probe microscopes that are capable of measuring physical and chemical properties on the nanoscale. Th ese microscopes-which were stimulated by the scanning tunneling microscope- have had a major impact on the understanding of material surfaces. The deve lopment of the key concepts of scanning probe microscopes is reviewed from their early history to current technologies. Some key applications of scann ing probe microscopes are presented and the future advances that are likely to come to fruition in the next decade are discussed. (C) 2000 Acta Metall urgica Inc. Published by Elsevier Science Ltd. All rights reserved.