The authors have characterised the microwave noise performance of AlGaN/GaN
HEMTs epitaxially grown on insulating BC substrates. The minimum noise fig
ure for 0.25 mu m gate-length devices was measured to be 0.77dB at 5 GHz an
d 1.06dB at 10GHz. The measured minimum noise figures are comparable to tho
se exhibited by GaAs-based FETs, which demonstrates the viability of AlGaN/
GaN HEMTs for low-noise applications.