An approach is proposed to test FPGA logic blocks, including part of the co
nfiguration memories used to control them. The proposed AND tree and OR tre
e-based testing structure is simple and the conditions for constant testabi
lity can easily be satisfied. Test generation for only a single logic block
is sufficient. We do not assume any particular fault model. Any number of
faulty blocks in the chip can be detected. Members of the Xilinx XC3000, XC
4000, and XC5200 families were studied. The proposed AND/OR approach was fo
und to reduce the number of FPGA reprogrammings needed for testing;by up to
a factor of seven versus direct methods of multiple faulty block detection
.