Shape and surface measurement technology by an improved shape-from-shadingneural algorithm

Authors
Citation
Sy. Cho et Tws. Chow, Shape and surface measurement technology by an improved shape-from-shadingneural algorithm, IEEE IND E, 47(1), 2000, pp. 225-230
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
ISSN journal
02780046 → ACNP
Volume
47
Issue
1
Year of publication
2000
Pages
225 - 230
Database
ISI
SICI code
0278-0046(200002)47:1<225:SASMTB>2.0.ZU;2-E
Abstract
A new approach for measuring the shape and surface of an object observed fr om a single camera is proposed. The proposed approach is based on using the neural networks as a parameteric representation of the three-dimensional o bject and the shape-from-shading problem is formulated as the minimization of an intensity error function with respect to the network weights. Experim ental results demonstrate that our proposed methodology exhibits high effic iency and accuracy for measuring and inspecting the product's surface in th e manufacturing industry.