Basic developmental steps are outlined for the application of metal organic
molecular beam epitaxy as an epitaxial fabrication process for InP-based i
ntegrated photonic circuits. Besides high-quality performance of the indivi
dual devices, implementation of Fe-doped semi-insulating layers and selecti
ve area deposition of GaInAsP for the whole composition range are of concer
n. Low-loss semi-insulating waveguides were fabricated for optically interc
onnecting and electrically isolating different devices at deposition condit
ions that have proven adequate for selective area growth and, simultaneousl
y, for effective suppression of Fe-movement. Fabricated laser/waveguide but
t-joints, a basic building block for any integrated photonic circuit, demon
strate the potential of metal organic molecular beam epitaxy to form practi
cally ideal lateral growth interfaces without compromising on device perfor
mance. (C) 2000 Elsevier Science B.V. All rights reserved.