Cathodoluminescence depth-profiling studies of GaN/AlGaN quantum-well structures

Citation
M. Godlewski et al., Cathodoluminescence depth-profiling studies of GaN/AlGaN quantum-well structures, J MATER RES, 15(2), 2000, pp. 495-501
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
08842914 → ACNP
Volume
15
Issue
2
Year of publication
2000
Pages
495 - 501
Database
ISI
SICI code
0884-2914(200002)15:2<495:CDSOGQ>2.0.ZU;2-X
Abstract
In this paper we evaluate the in-depth homogeneity of GaN epilayers and the influence of electric field present in strained GaN/AlGaN heterostructures and quantum wells on the yellow and "edge" emission in GaN and AlGaN. Our depth-profiling cathodoluminescence measurements show an increased accumula tion of defects at the interface. Inhomogeneities in the doping level are r eflected by the enhancement of the yellow emission in the interface region. The piezoelectric effect is found to strongly reduce the emission from the strained AlGaN quantum-well barriers, We also show that Ga droplets, commo nly found oil surfaces of samples grown in Ga-rich conditions, screen the i nternal electric field in a structure and thus result in a local enhancemen t of the edge emission intensity.