Experimental and theoretical demonstration of the interfacial interaction potential between an adsorbed film and a smooth substrate

The atomic force microscopy (AFM) technique has been developed to study the sublimation rare of an organic solid film on smooth surfaces. On the basis of the experimental results, a dipole-induced dipole propagation potential is employed to explain a nonlinear sublimation fate of a solid TNT thin fi lm in a very close proximity to the substrate surface. In this model, three important physical parameters, the bulk sublimation rate delta(o), surface interaction potential U-o, and the effective decay length of the surface p otential h(o), are introduced without any arbitrary constants. It is argued that the model-reflects a general phenomena rather than a special case.