Room-temperature photoenhanced wet chemical etching of MBE grown GaN has be
en studied during the processing of devices for a physics research programm
e. The process uses a 0.5 M KOH solution with illumination provided by a me
rcury are lamp emitting at 365 nm. The maximum etch rate achieved was simil
ar to 45 nm min (-1), much lower than that for MOCVD material etched under
similar conditions. Surface morphologies vary significantly for wafers etch
ed under nominally identical conditions, from surfaces with whiskers to hig
hly crystallographic faces. (C) 1999 Elsevier Science S.A. All rights reser
ved.