The influence of tensoeffect on TCR and stability of resistors

Citation
Rr. Avanesyan et al., The influence of tensoeffect on TCR and stability of resistors, MEAS TECH R, 42(7), 1999, pp. 655-657
Categorie Soggetti
Instrumentation & Measurement
Journal title
MEASUREMENT TECHNIQUES
ISSN journal
05431972 → ACNP
Volume
42
Issue
7
Year of publication
1999
Pages
655 - 657
Database
ISI
SICI code
0543-1972(199907)42:7<655:TIOTOT>2.0.ZU;2-9
Abstract
We consider the influence of tensoeffects on the TCR and relative change of resistance in resistors made of foil, thin film and thick film. This pheno menon is die to deformation of the resistive element caused by differences between the coefficients of bulk thermal expansion in the film and its subs trate.