Microscopic origin of the phenomenological equilibrium "doping limit rule'' in n-type III-V semiconductors

Citation
Sb. Zhang et al., Microscopic origin of the phenomenological equilibrium "doping limit rule'' in n-type III-V semiconductors, PHYS REV L, 84(6), 2000, pp. 1232-1235
Citations number
23
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
6
Year of publication
2000
Pages
1232 - 1235
Database
ISI
SICI code
0031-9007(20000207)84:6<1232:MOOTPE>2.0.ZU;2-F
Abstract
The highest equilibrium free-carrier doping concentration possible in a giv en material is limited by the "pinning energy" which shows a remarkable uni versal alignment in each class of semiconductors. Our first-principles tota l energy calculations reveal that equilibrium n-type doping is ultimately l imited by the spontaneous formation of close-shell acceptor defects: the (3 -)-charged cation vacancy in AlN, GaN, InP, and GaAs and the (1-)-charged D X center in AlAs, AlP, and GaP. This explains the alignment of the pinning energies and predicts the maximum equilibrium doping levels in different ma terials.