Behavior of intrinsic point defects in silicon

Authors
Okino, T
Citation
T. Okino, Behavior of intrinsic point defects in silicon, RRD APP PHY, 2, 1999, pp. 49-64
Categorie Soggetti
Current Book Contents
Journal title
RECENT RESEARCH DEVELOPMENTS IN APPLIED PHYSICS, VOL 2 (1999), PT 1 → ACNP
Volume
2
Year of publication
1999
Part
1
Pages
49 - 64
Database
ISI
SICI code