Scanning tunneling microscopy investigation of the C-terminated beta-SiC(100) c(2 x 2) surface reconstruction: dimer orientation, defects and antiphase boundaries

Citation
V. Derycke et al., Scanning tunneling microscopy investigation of the C-terminated beta-SiC(100) c(2 x 2) surface reconstruction: dimer orientation, defects and antiphase boundaries, SURF SCI, 446(1-2), 2000, pp. L101-L107
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
446
Issue
1-2
Year of publication
2000
Pages
L101 - L107
Database
ISI
SICI code
0039-6028(20000201)446:1-2<L101:STMIOT>2.0.ZU;2-N
Abstract
We investigate beta-SiC(100) c(2 x 2) surface reconstruction by atom-resolv ed scanning tunneling microscopy (filled and empty electronic states). The results indicate that, contrary to previous knowledge, the C=C triple-bond dimers that compose this surface are asymmetric and all tilted in the same direction (i.e. not anticorrelated), which suggests a compressive stress al ong the dimer direction. We also identify two specific defects: double dime r lines that are at the origin of antiphase boundaries, and missing dimers. In the latter case, the two nearest dimer neighbors along the dimer row ar e found to undergo a significant charge redistribution, leading to one of t hem being tilted in the opposite direction. (C) 2000 Elsevier Science B.V. All rights reserved.