Scanning tunneling microscopy investigation of the C-terminated beta-SiC(100) c(2 x 2) surface reconstruction: dimer orientation, defects and antiphase boundaries
V. Derycke et al., Scanning tunneling microscopy investigation of the C-terminated beta-SiC(100) c(2 x 2) surface reconstruction: dimer orientation, defects and antiphase boundaries, SURF SCI, 446(1-2), 2000, pp. L101-L107
We investigate beta-SiC(100) c(2 x 2) surface reconstruction by atom-resolv
ed scanning tunneling microscopy (filled and empty electronic states). The
results indicate that, contrary to previous knowledge, the C=C triple-bond
dimers that compose this surface are asymmetric and all tilted in the same
direction (i.e. not anticorrelated), which suggests a compressive stress al
ong the dimer direction. We also identify two specific defects: double dime
r lines that are at the origin of antiphase boundaries, and missing dimers.
In the latter case, the two nearest dimer neighbors along the dimer row ar
e found to undergo a significant charge redistribution, leading to one of t
hem being tilted in the opposite direction. (C) 2000 Elsevier Science B.V.
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