X-ray photoelectron spectroscopy (XPS) studies have been carried out on spu
tter deposited copper on a substantially hydroxylated alpha-Al2O3(0001) (sa
pphire) surface under ultra-high vacuum (UHV) conditions. XPS-derived Cu up
take curves show a sharp change in slope at a coverage of 0.35 ML (on a Cu/
O atomic basis), indicative of initial layer-by-layer growth. Cu(LMM) lines
hape data indicate that, prior to the first break in the curve, Cu is oxidi
zed to Cu(I). At higher coverages, metallic Cu(O) is observed. These data a
gree with first principles theoretical calculations, indicating that the pr
esence of adhydroxyl groups greatly enhances the binding of Cu to bulk sapp
hire surfaces, stabilizing Cu(I) adatoms over two-dimensional metallic isla
nds. In the absence of hydroxylation, calculations indicate significantly w
eaker Cu binding to the bulk sapphire substrate and non-wetting. Calculatio
ns also predict that at Cu coverages above 1/3 ML, Cu--Cu interactions pred
ominate, leading to Cu(O) formation. These results are in excellent agreeme
nt with experiment. The ability of surface hydroxyl groups to enhance bindi
ng to alumina substrates suggests a reason for contradictory experimental r
esults reported in the literature for Cu wetting of alumina. (C) 2000 Publi
shed by Elsevier Science B.V. All rights reserved.