ANISOTROPY OF FLUX-LINE ACTIVATION-ENERGY IN ND2-XCEXCUO4 THIN-FILM

Using Nd2-xCexCuO4 (NCC) film prepared by the reactive co-evaporation technique, we measured the temperature dependence of resistivity in th e mixed state as a function of the direction of magnetic field from th e basal plane. The activation energy at 0 K depended mainly on the c-a xis component of the field, but the basal component also seems to give a small contribution. This suggests that the appearance of the voltag e in the mixed state is determined mainly by flux lines parallel to th e c-axis.