Flight qualification of a diode laser for path difference determination ofa high-resolution Fourier transform spectrometer

Citation
G. Bianchini et al., Flight qualification of a diode laser for path difference determination ofa high-resolution Fourier transform spectrometer, APPL OPTICS, 39(6), 2000, pp. 962-965
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
6
Year of publication
2000
Pages
962 - 965
Database
ISI
SICI code
0003-6935(20000220)39:6<962:FQOADL>2.0.ZU;2-P
Abstract
Diode lasers offer a lightweight, rugged, and economic alternative to other types of laser but they often do not provide long-term stability! and spec tral purity of emission; We have developed a stabilized, near-infrared diod e laser source that is capable of as much as 20 mW of single-mode output po wer for the effective replacement of a He-Ne laser in the path difference m easuring system of a high-resolution (1.25-m maximum path difference) Fouri er transform spectrometer. Laser characterization has been performed both i n laboratory measurements and in flight tests, resulting in. relative frequ ency stability of better than 10(-6) on a 6-h flight. (C) 2000 Optical Soci ety of America.